Decrease of Charge Collection Due to Displacement Damage by Gamma Rays in a 6H-SiC Diode
Onoda, Shinobu, Ohshima, Takeshi, Hirao, Toshio, Mishima, Kenta, Hishiki, Shigeomi, Iwamoto, Naoya, Kojima, Kazuhisa, Kawano, KatsuyasuVolume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2007.910203
Date:
December, 2007
File:
PDF, 604 KB
english, 2007