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[IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (1990.03.5-1990.03.7)] International Conference on Microelectronic Test Structures - A new test structure to characterize the latchup effect
Cane, C., Lozano, M., Cabruja, E., Lora-Tamayo, E., Serra-Mestres, F.Year:
1990
DOI:
10.1109/ICMTS.1990.67878
File:
PDF, 371 KB
1990