Cooling process optimization to control Te inclusions for...

Materials Science in Semiconductor Processing 2015 / 02 Vol. 30

Cooling process optimization to control Te inclusions for improving CdZnTe detector performance

Liang, Xiao-yan, Min, Jia-hua, Yang, Sheng, Zhang, Ji-jun, Wang, Lin-jun, Zhao, Yue, Shi, Wei-min
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Volume:
30
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2014.09.032
Date:
February, 2015
File:
PDF, 1.22 MB
english, 2015
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