[IEEE 2013 IEEE/ACM International Conference on...

  • Main
  • [IEEE 2013 IEEE/ACM International...

[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design of cross-point metal-oxide ReRAM emphasizing reliability and cost

Niu, Dimin, Xu, Cong, Muralimanohar, Naveen, Jouppi, Norman P., Xie, Yuan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/ICCAD.2013.6691092
File:
PDF, 640 KB
english, 2013
Conversion to is in progress
Conversion to is failed