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[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design of cross-point metal-oxide ReRAM emphasizing reliability and cost
Niu, Dimin, Xu, Cong, Muralimanohar, Naveen, Jouppi, Norman P., Xie, YuanYear:
2013
Language:
english
DOI:
10.1109/ICCAD.2013.6691092
File:
PDF, 640 KB
english, 2013