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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Functional test for shifting-type FIFOs
van de Goor, A.J., Schanstra, I., Zorian, Y.Year:
1995
Language:
english
DOI:
10.1109/EDTC.1995.470408
File:
PDF, 515 KB
english, 1995