[IEEE 2012 IEEE International Conference on Cyber...

  • Main
  • [IEEE 2012 IEEE International...

[IEEE 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Bangkok (2012.05.27-2012.05.31)] 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Test effectiveness index: Integrating product metrics with process metrics

Yan Zhang,, Xuying Zhao,, Xiaokun Zhang,, Tian Zhang,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/CYBER.2012.6392526
File:
PDF, 138 KB
english, 2012
Conversion to is in progress
Conversion to is failed