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[IEEE 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Bangkok (2012.05.27-2012.05.31)] 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Test effectiveness index: Integrating product metrics with process metrics
Yan Zhang,, Xuying Zhao,, Xiaokun Zhang,, Tian Zhang,Year:
2012
Language:
english
DOI:
10.1109/CYBER.2012.6392526
File:
PDF, 138 KB
english, 2012