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Nondestructive defect identification with terahertz time-of-flight tomography
Hua Zhong, Jingzhou Xu, Xu Xie, Tao Yuan, R. Reightler, E. Madaras, Xi-cheng ZhangVolume:
5
Year:
2005
Language:
english
DOI:
10.1109/JSEN.2004.841341
File:
PDF, 658 KB
english, 2005