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[IEEE 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering (CMCE 2010) - Changchun, China (2010.08.24-2010.08.26)] 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering - A selection sort method of test cases based on severity of defects
Xiuping Hou,, Guangqi Tang,, Hong Zheng,, Yanli Wang,Year:
2010
Language:
english
DOI:
10.1109/CMCE.2010.5610487
File:
PDF, 528 KB
english, 2010