![](/img/cover-not-exists.png)
[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Analysis of within-die process variation in 65nm FPGAs
Tuan, Tim, Lesea, Austin, Kingsley, Chris, Trimberger, SteveYear:
2011
Language:
english
DOI:
10.1109/ISQED.2011.5770808
File:
PDF, 3.43 MB
english, 2011