![](/img/cover-not-exists.png)
[IEEE Test Symposium (EWDTS) - Lviv, Ukraine (2008.10.9-2008.10.12)] Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) - An IEEE 1500 compatible wrapper architecture for testing cores at transaction level
Refan, Fatemeh, Prinetto, Paolo, Navabi, ZainalabedinYear:
2008
Language:
english
DOI:
10.1109/EWDTS.2008.5580141
File:
PDF, 349 KB
english, 2008