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[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Test structures for interdie variations monitoring in presence of statistical random variability
Castaneda, Giancarlo, Juge, Andre, Ghibaudo, Gerard, Golanski, Dominique, Hoguet, David, Portal, Jean-Michel, Borot, BertrandYear:
2012
Language:
english
DOI:
10.1109/ICMTS.2012.6190609
File:
PDF, 1.63 MB
english, 2012