[IEEE 2007 IEEE International Test Conference - Santa...

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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques

Leininger, Andreas, Fischer, Martin, Braun, Michael, Richter, Michael, Goessel, Michael
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Year:
2007
Language:
english
DOI:
10.1109/TEST.2007.4437577
File:
PDF, 281 KB
english, 2007
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