[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques
Leininger, Andreas, Fischer, Martin, Braun, Michael, Richter, Michael, Goessel, MichaelYear:
2007
Language:
english
DOI:
10.1109/TEST.2007.4437577
File:
PDF, 281 KB
english, 2007