[IEEE ESSDERC 2003. 33rd European Solid-State Device...

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[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns

Kaczer, B., Degraeve, R., Augendre, E., Jurczak, M., Groeseneken, G.
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Year:
2003
Language:
english
DOI:
10.1109/ESSDERC.2003.1256814
File:
PDF, 290 KB
english, 2003
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