![](/img/cover-not-exists.png)
[IEEE ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Penang, Malaysia (26-28 Nov. 1996)] ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Investigation of drain electric field and its role in impact ionization in SOI MOSFETs
Chi-Man Ng,, Nguyen, C.T.Year:
1996
Language:
english
DOI:
10.1109/SMELEC.1996.616454
File:
PDF, 531 KB
english, 1996