[IEEE 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Beijing, China (2010.04.12-2010.04.16)] 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Reduction of radiated electric fields for ESD immunity design
Hsing-Yi Chen,, Jun-Kuan Li,Year:
2010
Language:
english
DOI:
10.1109/APEMC.2010.5475809
File:
PDF, 673 KB
english, 2010