[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Physical failure analysis to distinguish EOS and ESD failures
Tung Chih Hang,, Cheng Cheng Kou,, Radhakrishnan, M.K., Iyer, N.M.Year:
2002
Language:
english
DOI:
10.1109/IPFA.2002.1025613
File:
PDF, 1.27 MB
english, 2002