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[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - Investigation of lateral charge distribution of 2-bit SONOS memory devices using physically separated twin SONOS structure
Byung Yong Choi,, Choong-Ho Lee,, Yong Kyu Lee,, Hyungcheol Shin,, Jong Duk Lee,, Byung-Gook Park,, Dong-Won Kim,, Suk-Kang Sung,, Se Hoon Lee,, Byung-Kyu Cho,, Tae-Yong Kim,, Eun Suk Cho,Year:
2006
Language:
english
DOI:
10.1109/ICMTS.2006.1614273
File:
PDF, 405 KB
english, 2006