Working Thermal Stresses in AlGaAs/GaAs High-Power Laser...

IEEE Transactions on Device and Materials Reliability 2014 / 03 Vol. 14; Iss. 1

Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography

Qiao, Yanbin, Feng, Shiwei, Xiong, Cong, Zhu, Hui
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2279253
Date:
March, 2014
File:
PDF, 472 KB
english, 2014
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