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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Fault coverage analysis in monitored sequential circuits
Parekhji, R.A., Venkatesh, G., Sherlekar, S.D.Year:
1994
Language:
english
DOI:
10.1109/ATS.1994.367257
File:
PDF, 475 KB
english, 1994