[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - A methodology for measuring transistor ageing effects towards accurate reliability simulation
Maricau, Elie, Gielen, GeorgesYear:
2009
Language:
english
DOI:
10.1109/IOLTS.2009.5195978
File:
PDF, 267 KB
english, 2009