[IEEE Multi-Physics simulation and Experiments in Microelectronics - Freiburg im Breisgau, Germany (2008.04.20-2008.04.23)] EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems - Predictive models for μBGA and QFN reliability estimation
Wilde, Juergen, Zukowski, ElenaYear:
2008
Language:
english
DOI:
10.1109/ESIME.2008.4525092
File:
PDF, 3.06 MB
english, 2008