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[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Automatic dependency model generation using SPICE event driven simulation
Nair, R., Chujen Lin,, Haynes, L., Kelley, B., Levy, R., Prasad, P.Year:
1996
Language:
english
DOI:
10.1109/AUTEST.1996.547720
File:
PDF, 865 KB
english, 1996