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[IEEE Comput. Soc 11th IEEE International Requirements Engineering Conference - Monterey Bay, CA, USA (8-12 Sept. 2003)] Journal of Lightwave Technology - Understanding and comparing model-based specification notations
Niu, J., Atlee, J.M., Day, N.A.Year:
2003
Language:
english
DOI:
10.1109/ICRE.2003.1232750
File:
PDF, 426 KB
english, 2003