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Complementary model for intrinsic time-dependent dielectric breakdown in SiO[sub 2] dielectrics
J. W. Mcpherson, R. B. Khamankar, A. ShanwareVolume:
88
Year:
2000
Language:
english
DOI:
10.1063/1.1318369
File:
PDF, 621 KB
english, 2000