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[IEEE 2011 IEEE-IAS/PCA Cement Industry Conference - St. Louis, MO, USA (2011.05.22-2011.05.26)] 2011 IEEE-IAS/PCA 53rd Cement Industry Technical Conference - A new method for analyzing particle attrition dynamics using three-dimensional profiling
Buchanan, Gregory, Buchanan, Charles E.Year:
2011
Language:
english
DOI:
10.1109/CITCON.2011.5934561
File:
PDF, 2.50 MB
english, 2011