[IEEE 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Hose, CA, USA (2014.5.20-2014.5.23)] IEEE International Interconnect Technology Conference - Switching and reliability mechanisms for ReRAM
Wei, Zhiqiang, Ninomiya, Takeki, Muraoka, Shunsaku, Katayama, Koji, Yasuhara, Ryutaro, Mikawa, TakumiYear:
2014
Language:
english
DOI:
10.1109/IITC.2014.6831832
File:
PDF, 821 KB
english, 2014