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[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)
Benard, Christelle, Ogier, Jean-Luc, Goguenheim, DidierYear:
2008
Language:
english
DOI:
10.1109/IRWS.2008.4796122
File:
PDF, 255 KB
english, 2008