[IEEE Japan International Electronic Manufacturing Technology Symposium - Kanazawa, Japan (June 9-11, 1993)] Proceedings of Japan International Electronic Manufacturing Technology Symposium - Degradation Of Tab Outer Lead Contacts Due To The Au Concentration In Eutectic Tin/lead Solder
Zakel, E., Azdasht, G., Reich, H.Year:
1993
Language:
english
DOI:
10.1109/IEMT.1993.639790
File:
PDF, 970 KB
english, 1993