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[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - A novel architecture to reduce test time in march-based SRAM tests
Voyiatzis, I., Efstathiou, C., Tsiatouhas, Y., Sgouropoulou, C.Year:
2012
Language:
english
DOI:
10.1109/DTIS.2012.6232963
File:
PDF, 298 KB
english, 2012