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[IEEE 2013 IEEE International Conference on Imaging Systems and Techniques (IST) - Beijing, China (2013.10.22-2013.10.23)] 2013 IEEE International Conference on Imaging Systems and Techniques (IST) - Industrial character recognition based on grid feature and wavelet moment
Zhang, Yong, Xie, Sanxia, Wei, ShuYear:
2013
Language:
english
DOI:
10.1109/IST.2013.6729662
File:
PDF, 143 KB
english, 2013