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[IEEE 2012 IEEE Subthreshold Microelectronics Conference (SubVT) - Waltham, MA, USA (2012.10.9-2012.10.10)] 2012 IEEE Subthreshold Microelectronics Conference (SubVT) - SRAM sense amplifier offset cancellation using BTI stress
Beshay, Peter, Bolus, Jonathan, Blalock, Travis, Chandra, Vikas, Calhoun, Benton H.Year:
2012
Language:
english
DOI:
10.1109/SubVT.2012.6404299
File:
PDF, 748 KB
english, 2012