[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A sequential redundant fault identification scheme and its application to test generation
Hsing-Chung Liang,, Chung Len Lee,, Chen, J.E.Year:
1994
Language:
english
DOI:
10.1109/ATS.1994.367253
File:
PDF, 519 KB
english, 1994