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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Engineering optimal high current characteristics of high voltage DENMOS
Salman, Akram A, Farbiz, Farzan, Appaswamy, Aravind, Kunz, Hans, Boselli, Gianluca, Dissegna, MarianoYear:
2012
Language:
english
DOI:
10.1109/IRPS.2012.6241819
File:
PDF, 338 KB
english, 2012