[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - EBIC Investigations on Active Polymer Devices
Pugatschow, A., Heiderhoff, R., Forster, M., Scherf, U., Balk, L.J.Year:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378088
File:
PDF, 3.62 MB
english, 2007