[IEEE 2010 IEEE Dallas Circuits and Systems Workshop (DCAS) - Richardson, TX, USA (2010.10.17-2010.10.18)] 2010 IEEE Dallas Circuits and Systems Workshop - Device physics origin and solutions to threshold voltage fluctuations in sub 130 nm CMOS incorporating halo implant
Edwards, Hal, Chatterjee, Tathagata, Kassem, Mohamed, Gomez, Gabriel, Hou, Fan-Chi, Wu, XiaojuYear:
2010
Language:
english
DOI:
10.1109/DCAS.2010.5955031
File:
PDF, 325 KB
english, 2010