[IEEE Proceedings Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (1997.09.25-1997.09.25)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - A Robust ESD Event Locator System With Event Characterization
Lin, D.L., DeChiaro, L.F., Jon, M.-C.Year:
1997
Language:
english
DOI:
10.1109/EOSESD.1997.634230
File:
PDF, 994 KB
english, 1997