[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Modeling on-chip variations in digital circuits using statistical timing analysis
Petrosyan, Gor, Abovyan, Sargis, Harutyunyan, TigranYear:
2010
Language:
english
DOI:
10.1109/EWDTS.2010.5742038
File:
PDF, 582 KB
english, 2010