[IEEE ISCAS 2003. International Symposium on Circuits and...

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[IEEE ISCAS 2003. International Symposium on Circuits and Systems - Bangkok, Thailand (25-28 May 2003)] Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. - A modular test structure for CMOS mismatch characterization

Conti, M., Crippa, P., Fedecostante, F., Orcioni, S., Ricciardi, F., Turchetti, C., Vendrame, L.
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Volume:
5
Year:
2003
Language:
english
DOI:
10.1109/ISCAS.2003.1206376
File:
PDF, 286 KB
english, 2003
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