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[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Enhanced EM endurance of TiN/AlCu/TiN/sub x/ interconnection
Jeong Soo Byun,, Jun Ki Kim,, Kwan Goo Rha,, Woo Shik Kim,Year:
1994
Language:
english
DOI:
10.1109/IRWS.1994.515844
File:
PDF, 77 KB
english, 1994