[IEEE 2008 IEEE International Symposium on VLSI Design,...

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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A universal look-ahead algorithm for pipelining IIR filters

Yen-Liang Chen,, Chun-Yu Chen,, Kai-Yuan Jheng,, An-Yeu Wu,
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Year:
2008
Language:
english
DOI:
10.1109/VDAT.2008.4542462
File:
PDF, 163 KB
english, 2008
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