[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) -...

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[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Impact of atomic oxide roughness and local gate depletion on Vth variation in MOSFETs

Putra, Arifin Tamsir, Tsunomura, Takaaki, Nishida, Akio, Kamohara, Shiro, Takeuchi, Kiyoshi, Hiramoto, Toshiro
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Year:
2008
Language:
english
DOI:
10.1109/SNW.2008.5418448
File:
PDF, 1.59 MB
english, 2008
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