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[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - New charge trapping phenomena in Recessed-Channel-Array-Transistor (RCAT) after Fowler-Nordheim stress
Sung-Young Lee,, Park, Se Geun, Samjin Hwang,, Jaeeun Jeon,, Wonshik Lee,Year:
2008
Language:
english
DOI:
10.1109/ICICDT.2008.4567234
File:
PDF, 475 KB
english, 2008