![](/img/cover-not-exists.png)
[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters
Tenbroek, B.M., Redman-White, W., Lee, M.S.L., Bunyan, R.J.T., Uren, M.J.Year:
1997
Language:
english
DOI:
10.1109/SOI.1997.634959
File:
PDF, 171 KB
english, 1997