[IEEE 1997 IEEE International SOI Conference Proceedings -...

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[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters

Tenbroek, B.M., Redman-White, W., Lee, M.S.L., Bunyan, R.J.T., Uren, M.J.
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Year:
1997
Language:
english
DOI:
10.1109/SOI.1997.634959
File:
PDF, 171 KB
english, 1997
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