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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Using verification technology for validation coverage analysis and test generation
Moundanos, D., Abraham, J.A.Year:
1998
Language:
english
DOI:
10.1109/VTEST.1998.670877
File:
PDF, 198 KB
english, 1998