Markov model for threshold-voltage shift in amorphous...

Markov model for threshold-voltage shift in amorphous silicon TFTs for variable gate bias

S. Sambandan, Lei Zhu, D. Striakhilev, P. Servati, A. Nathan
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Volume:
26
Year:
2005
Language:
english
DOI:
10.1109/LED.2005.848116
File:
PDF, 186 KB
english, 2005
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