Markov model for threshold-voltage shift in amorphous silicon TFTs for variable gate bias
S. Sambandan, Lei Zhu, D. Striakhilev, P. Servati, A. NathanVolume:
26
Year:
2005
Language:
english
DOI:
10.1109/LED.2005.848116
File:
PDF, 186 KB
english, 2005