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Factors affecting the grain yield predicting attributes of spectral reflectance indices in durum wheat: growing conditions, genotype variability and date of measurement
Bort, J., Casadesus, J., Nachit, M. M., Araus, J. L.Volume:
26
Language:
english
Journal:
International Journal of Remote Sensing
DOI:
10.1080/01431160512331337808
Date:
June, 2005
File:
PDF, 430 KB
english, 2005