[IEEE [1992] 4th International Conference on Conduction and...

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[IEEE [1992] 4th International Conference on Conduction and Breakdown in Solid Dielectrics - Sestri Levante, Italy (22-25 June 1992)] [1992] Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics - Detection of degradation in opaque dielectrics by ultrasound

Auckland, D.W., Smith, C.D., Varlow, B.R.
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Year:
1992
Language:
english
DOI:
10.1109/ICSD.1992.224928
File:
PDF, 234 KB
english, 1992
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