Single-event sensitivity of a single SRAM cell
Darracq, F., Beauchene, T., Pouget, V., Lapuyade, H., Lewis, D., Fouillat, P., Touboul, A.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2002.1039688
Date:
June, 2002
File:
PDF, 241 KB
english, 2002