Evaluation technology of VLSI reliability using hot carrier...

Evaluation technology of VLSI reliability using hot carrier luminescence

Y. Uraoka, N. Tsutsu, Y. Nakata, S. Akiyama
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Volume:
4
Year:
1991
Language:
english
DOI:
10.1109/66.85938
File:
PDF, 1.11 MB
english, 1991
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