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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - State encoding and functional decomposition for self-checking sequential circuit design
Pagey, S., Sherlekar, S.D., Venkatesh, G.Year:
1993
Language:
english
DOI:
10.1109/ATS.1993.398820
File:
PDF, 407 KB
english, 1993